发明名称 |
Method of and program product for performing gate-level diagnosis of failing vectors |
摘要 |
A method of fault diagnosis of integrated circuits having failing test vectors with observed fault effects using fault candidate fault-effects obtained by simulation of a set of test vectors, comprises determining a fault candidate diagnostic measure for each fault candidate, the fault candidate diagnostic measure having a fault candidate match metric, an observed fault effect mismatch metric and a fault candidate excitation metric, ranking fault candidates in decreasing diagnostic measure order; and identifying fault candidate(s) having the highest diagnostic measure as the most likely cause of observed fault effects.
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申请公布号 |
US2003217315(A1) |
申请公布日期 |
2003.11.20 |
申请号 |
US20030435094 |
申请日期 |
2003.05.12 |
申请人 |
MAAMARI FADI;SHUM SONNY NGAI SAN;NADEAU-DOSTIE BENOIT |
发明人 |
MAAMARI FADI;SHUM SONNY NGAI SAN;NADEAU-DOSTIE BENOIT |
分类号 |
G01R31/3177;(IPC1-7):G06F11/00;G01R31/28 |
主分类号 |
G01R31/3177 |
代理机构 |
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