发明名称 Scanning microscope and beam deflection device
摘要 A scanning microscope has a light source that generates a light beam for illumination of a specimen, and has a beam deflection device with which the light beam can be guided over the specimen. The beam deflection device contains at least one rotatable unit having at least one reflecting mirror. A compensation element that executes a motion equal and opposite to that of the rotatable unit is arranged in such a way that it at least partially compensates for the moment of inertia of the rotatable unit.
申请公布号 US2003214707(A1) 申请公布日期 2003.11.20
申请号 US20030439742 申请日期 2003.05.16
申请人 LEICA MICROSYSTEMS 发明人 ENGELHARDT JOHANN
分类号 G02B21/00;(IPC1-7):G02B21/06 主分类号 G02B21/00
代理机构 代理人
主权项
地址
您可能感兴趣的专利