| 摘要 |
There are provided a method and an apparatus for displaying test results and a recording medium, which allow easy detection of DUT's in which probes are destroyed. The apparatus has two wafer probers, a work station, and a PC. On the basis of a display program and a display mode switching program stored in a ROM of the work station, respective test results of testing semiconductor chips by the two wafer probers are displayed on a CRT of the PC in correspondence to positions of the semiconductor chips on a wafer substrate, and, at the same time, a pass/fail ratio for each of the DUT's is displayed in parallel with the test results of the semiconductor chips.
|
