| 摘要 |
PROBLEM TO BE SOLVED: To grasp precise position on a test program when a warning is generated. SOLUTION: A semiconductor integrated-circuit testing apparatus for testing a device under test on the basis of the test program is provided with an execution-position storage means 2c1 used to sequentially update and store an execution position on the test program, a warning control unit 2e used to output the execution position stored in the storage means 2c1 as a warning position, and a display device 4 used to display the warning position to be input from the control unit 2e. COPYRIGHT: (C)2004,JPO
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