发明名称 CONTACT PROBE PIN
摘要 PROBLEM TO BE SOLVED: To solve the problem that a conventional contact probe pin gives damage to an element to be measured like a solder ball since the same pressure is applied to two objects having different hardnesses. SOLUTION: The solder ball 8 is pressed by a first plunger 1, brought into contact with the plunger 1, and electrically connected to the pad 10 on a test board 9 via a first spring 3 having a internal spring constant set to a small value, a separating part 6 fixed to a barrel 5, a second spring 4 having a large spring constant, and a second plunger 2. The first and the second springs 3 and 4 are separated so as not to affect each other by the part 6. Further, the barrel 5 is assembled in a socket base 11 and mounted on the board 9. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003329707(A) 申请公布日期 2003.11.19
申请号 JP20020132559 申请日期 2002.05.08
申请人 NEC KYUSHU LTD 发明人 KAWAHARA SHOICHI
分类号 G01R31/26;G01R1/067;(IPC1-7):G01R1/067 主分类号 G01R31/26
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