发明名称 METHOD FOR INSPECTING OBJECT LAYER TO BE INSPECTED AND DEVICE FOR INSPECTING THE SAME
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a method for inspecting an object layer to be inspected that easily judges the pass/fail of the object formed by the oxidization of a positive electrode, and a device for inspecting the same that easily judges the pass/fail of the object. <P>SOLUTION: An inspection device body 30 is provided of a light irradiating part 31 irradiating light to the surface of a sample C, a light receiving part 32 receiving the light reflected with the surface thereof, a control part 35 controlling the output timing of the light irradiating part 31 with controlling the activation of a stage ST, an evaluation part 33 for the strength of optical reflection determining the distribution of the reflection factors of the sample C from the output of the light receiving part 32, and a pass/fail judging part 34 judging the pass/fail from the output of the evaluation part 33. <P>COPYRIGHT: (C)2004,JPO</p>
申请公布号 JP2003329575(A) 申请公布日期 2003.11.19
申请号 JP20020138995 申请日期 2002.05.14
申请人 MATSUSHITA ELECTRIC WORKS LTD 发明人 WATABE YOSHIFUMI;AIZAWA KOICHI;KOMODA TAKUYA;HATAI TAKASHI;HONDA YOSHIAKI
分类号 G01N21/17;G01N21/47;H01J9/02;H01J9/42;(IPC1-7):G01N21/17 主分类号 G01N21/17
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