| 摘要 |
PROBLEM TO BE SOLVED: To provide a test circuit by which a large-scale semiconductor device is self-tested at an actual operating speed only by additing a few circuits by using a boundary scan register, and which outputs only its test result to the outside. SOLUTION: Boundary scan cells are installed at respective input/output pins of the semiconductor device, the boundary scan cells in the prescribed number are connected in series, and the boundary scan register of a feedback shift register constitution is constituted. COPYRIGHT: (C)2004,JPO
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