发明名称 Method of manufacturing MOSFET and structure thereof
摘要 A method of manufacturing an MOSFET. A substrate is provided. A trench filled with an insulating layer is formed in the substrate. The upper portion of the insulating layer is removed and then a spacer is formed on the side-wall of the trench. A sacrificial layer is formed to fill the trench. A doped semiconductive layer is formed over the substrate and then patterned to form a device region, wherein the device region spans the sacrificial layer to expose a portion of the sacrificial layer. The sacrificial layer is removed. A gate dielectric layer is formed on the exposed surface of the device region. A conductive layer is formed on the gate dielectric layer and then patterned to form a horizontal surround gate surrounding the device region. A source/drain region is formed in a portion of the substrate adjacent to the device region.
申请公布号 US6649979(B2) 申请公布日期 2003.11.18
申请号 US20010005624 申请日期 2001.12.04
申请人 WINBOND ELECTRONICS CORP. 发明人 JANG WEN-YUEH
分类号 H01L21/336;H01L29/423;H01L29/78;H01L29/786;(IPC1-7):H01L27/01;H01L27/12;H01L31/113 主分类号 H01L21/336
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