发明名称 Method of manufacturing photomask
摘要 A method of manufacturing a photomask includes determining an average value of dimensions of a pattern in a photomask. determining an in-plane uniformity of the dimensions, determining an exposure latitude on the basis of the average value and the in-plane uniformity. The exposure latitude depends on dimensional accuracy of the pattern. Judging if the photomask is defective or non-defective is made on the basis of whether or not the exposure latitude falls within a prescribed exposure latitude
申请公布号 US6649310(B2) 申请公布日期 2003.11.18
申请号 US20010940578 申请日期 2001.08.29
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 ITOH MASAMITSU;NOJIMA SHIGEKI;MIMOTOGI SHOJI;IKENAGA OSAMU
分类号 G03F1/08;G03F1/00;G03F7/20;(IPC1-7):G03F9/00 主分类号 G03F1/08
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