发明名称 Method to selectively remove one side of a conductive bottom electrode of a phase-change memory cell and structure obtained thereby
摘要 The invention relates to a phase-change memory device. The device includes a lower electrode disposed in a recess of a first dielectric. The lower electrode comprises a first side and a second side. The first side communicates to a volume of phase-change memory material. The second side has a length that is less than the first side. Additionally, a second dielectric may overlie the lower electrode. The second dielectric has a shape that is substantially similar to the lower electrode.The present invention also relates to a method of making a phase-change memory device. The method includes providing a lower electrode material in a recess. The method also includes removing at least a portion of the second side.
申请公布号 US6649928(B2) 申请公布日期 2003.11.18
申请号 US20000737614 申请日期 2000.12.13
申请人 INTEL CORPORATION 发明人 DENNISON CHARLES
分类号 H01L27/102;H01L27/24;H01L29/861;(IPC1-7):H01L47/00 主分类号 H01L27/102
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