发明名称 Synthetic free layer structure for MRAM devices
摘要 An MRAM cell includes a bottom electrode layer, a magnetic reference layer, an insulating layer, a synthetic free layer, and a top electrode layer. The synthetic free layer includes a first magnetic layer, a ruthenium anti-ferromagnetic coupling layer, and a second magnetic layer. The magnetic reference layer and the first and second magnetic layers are fabricated using magnetic materials such as CoFeB, CoFe, or a bilayer of NiFe and CoFe. The first magnetic layer of the synthetic free layer is made thicker than the second magnetic layer of the synthetic free layer for proper operation.
申请公布号 US6649960(B1) 申请公布日期 2003.11.18
申请号 US20010025271 申请日期 2001.12.18
申请人 MAXTOR CORPORATION 发明人 CROSS RALPH WILLIAM
分类号 G11C11/15;H01L27/22;H01L43/08;(IPC1-7):H01L29/72 主分类号 G11C11/15
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