| 摘要 |
PROBLEM TO BE SOLVED: To surely prevent to wrong reading of information from a semiconductor device, falsifying of the information or the like and surely reduce the area of the semiconductor device. SOLUTION: An internal circuit 10 is formed in a chip region Rc and pads 12 for inspection, electrically connected to the internal circuit 10, are formed in a scribe region Rs. Further, input protective circuits 17, electrically connected to the internal circuit 10 and the pads 12 for inspection while preventing the inflow of an excessive current from the pads 12 for inspection into the internal circuit 10, are formed in the scribe region Rs and the vicinity of the same. COPYRIGHT: (C)2004,JPO
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