发明名称 TEST CIRCUIT AND TEST METHOD FOR COMMUNICATION SYSTEM
摘要 PROBLEM TO BE SOLVED: To self-test a communication system for performing transmission- reception at high communication speed at its actual operating speed at low cost without increasing a chip area. SOLUTION: Test parallel data are generated by a test signal generation unit and the parallel data are converted to serial data by a transmitter for test. Serial data outputted from the transmitter for test are selectively supplied to a receiver via a selector during a test operation and converted to parallel data by the receiver. Thereafter, the presence/absence of an error in the parallel data outputted from the receiver is detected by an error detector. In such a case, only one transmitter is provided in accordance with a plurality of receivers, and the serial data outputted from the transmitter are supplied commonly to all the receivers via the selector. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003324499(A) 申请公布日期 2003.11.14
申请号 JP20030018248 申请日期 2003.01.28
申请人 KAWASAKI MICROELECTRONICS KK 发明人 KASHIWAKURA SHOICHIRO
分类号 G01R31/28;H01L21/822;H01L27/04;H04L25/02;H04L29/14;(IPC1-7):H04L29/14 主分类号 G01R31/28
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