发明名称 |
METHOD FOR INSPECTING LIGHTING OF LIQUID CRYSTAL DISPLAY ELEMENT |
摘要 |
PROBLEM TO BE SOLVED: To facilitate lighting inspection without the need for expensive probe pins even in the case of a high precision pattern having a narrow pitch of electrode leads on the terminal part in a COG type liquid crystal display element. SOLUTION: Electrode leads formed on the terminal part are constituted of longer electrode leads Ra and shorter electrode leads Rb. Leakage inspection is performed by applying a lighting voltage to each longer electrode lead at the same time by using probers of a predetermined length, and disconnection inspection is performed by applying the lighting voltage at the same time to all the electrode leads belonging to each group irrespective of the lengths by using the same probers. COPYRIGHT: (C)2004,JPO
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申请公布号 |
JP2003322872(A) |
申请公布日期 |
2003.11.14 |
申请号 |
JP20020128171 |
申请日期 |
2002.04.30 |
申请人 |
OPTREX CORP;NIPPON SEIKI CO LTD |
发明人 |
TAGUCHI KAZUNAGA |
分类号 |
G02F1/13;G02F1/1345;(IPC1-7):G02F1/134 |
主分类号 |
G02F1/13 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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