发明名称 CODE ERROR MEASURING APPARATUS AND METHOD, PN PATTERN GENERATING APPARATUS AND METHOD, AND SYNCHRONIZATION APPARATUS
摘要 <p><P>PROBLEM TO BE SOLVED: To shorten a measuring time of a code error rate. <P>SOLUTION: The apparatus is provided with a synchronization detecting part a21 for parallel converting a receiving pattern obtained from a target, detecting a specific element pattern for a bit length as long as the number of stages of a predetermined PN out of its parallel bits, as a synchronous pattern, outputting a detection trigger signal representing the detection, shifting the bits of the receiving pattern such that the synchronous pattern becomes a head of the parallel bits, and outputting the receiving pattern as a receiving pattern for measurement, a PN pattern generating part a22 for successively generating and outputting a PN pattern of a mark rate 1/2 restored based upon the detection trigger signal and the synchronous pattern, a mark rate varying part a23 for varying the mark rate of the PN pattern of the mark rate 1/2 outputted from the PN pattern generating part in accordance with a mark rate of the receiving pattern and outputting the PN pattern as an expected pattern, and an error detecting part a24 for detecting a code error of the receiving pattern by comparing the expected pattern and the receiving pattern for measurement. <P>COPYRIGHT: (C)2004,JPO</p>
申请公布号 JP2003324411(A) 申请公布日期 2003.11.14
申请号 JP20020128841 申请日期 2002.04.30
申请人 ANDO ELECTRIC CO LTD;KYUSHU ANDO DENKI KK 发明人 TSUTSUMI SEIICHI;SHIDA HIDEO
分类号 H04L1/00;H04L7/00;(IPC1-7):H04L1/00 主分类号 H04L1/00
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