发明名称 |
PHOTOMASK, METHOD FOR MAKING UP THE SAME AND PATTERN FORMING METHOD USING THE SAME |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To simultaneously increase the fineness of an isolated space pattern and the fineness of an isolated line pattern or the fineness of a dense pattern. <P>SOLUTION: A phase shifting film 11 which transmits exposure light at a low transmittance after phase inversion is formed on the upper region of a transparent substrate 10 except a light transmissive portion forming region (opening forming region). The opening forming region and its peripheral part in the transparent substrate 10 are hollowed out by such a thickness as to cause phase inversion to exposure light to form a light transmissive portion (opening). The peripheral part of the opening in the phase shifting film 11 is overhang. <P>COPYRIGHT: (C)2004,JPO</p> |
申请公布号 |
JP2003322950(A) |
申请公布日期 |
2003.11.14 |
申请号 |
JP20020128045 |
申请日期 |
2002.04.30 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
MITSUSAKA AKIO |
分类号 |
G03F1/29;G03F1/32;G03F1/68;G03F7/20;H01L21/027;(IPC1-7):G03F1/08 |
主分类号 |
G03F1/29 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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