Memory circuit testing system, semiconductor device, and memory testing method

摘要

A semiconductor device that performs refresh tests of a plurality of individual memories built into the same chip and prevents excessive testing during the refresh test. When a first testing circuit enters a wait state, the first testing circuit issues a refresh command REF to a first memory circuit. Then, the first memory circuit refreshes the memory cells until a second testing circuit enters the wait state. That is, since the memory cells of the first memory circuit are refreshed until the writing to a second memory circuit ends, the refresh test time of the first and second memory circuits are the same.