| 摘要 |
The test card, in particular, for direct current measurements on high-frequency electronic wafer based components comprises measuring pins (18, 20) which are attached to the card by means of a material (16) containing ferrite. Independent claims are also included for (a) a measuring pin insert for such a test card, and (b) an application of the proposed test card and/or measuring pin insert for direct current characterization of high-frequency components, in particular, high electron mobility transistors.
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