发明名称 PROCESS AND DEVICE FOR MEASURING LIGHT BEAMS
摘要 <p>PCT No. PCT/CH96/00275 Sec. 371 Date Jun. 23, 1997 Sec. 102(e) Date Jun. 23, 1997 PCT Filed Aug. 7, 1996 PCT Pub. No. WO97/09594 PCT Pub. Date Mar. 18, 1997A light beam (6) is applied to a waveguide (3) in order to measure properties of the beam (6), e.g. the wavelength. According to the invention, the waveguide (3) has locally and/or time-varying resonances, e.g. by suitably designed grid couplers (4, 5). A light signal (7) is thus generated in the waveguide (3) as a direct measurement of the property to be measured and can be further processed by suitable means or evaluated. It is thus possible, for example, advantageously to produce a simple and inexpensive spectrometer.</p>
申请公布号 EP0795121(B1) 申请公布日期 2003.11.12
申请号 EP19960924729 申请日期 1996.08.07
申请人 PAUL SCHERRER INSTITUT 发明人 KUNZ, RINO, ERNST;DUEBENDORFER, JUERG
分类号 G01J3/18;(IPC1-7):G01J9/02;H01S3/13 主分类号 G01J3/18
代理机构 代理人
主权项
地址