发明名称 PLASMA RAPID THERMAL PROCESSING(RTP) APPARATUS
摘要 PURPOSE: A plasma RTP(Rapid Thermal Processing) apparatus is provided to be capable of conserving a low thermal budget and improving temperature uniformity. CONSTITUTION: A plasma RTP apparatus is provided with a process chamber for stably loading a wafer, a heating part installed at the process chamber for heating the wafer, and a plasma supply part connected to the process chamber for supplying the process gas of radical state into the process chamber. At this time, the process chamber includes a jet part and an exhaust port(170) at the lateral portion of the same. At the time, the heating part includes a body part(210) and a plurality of lamps(220). Preferably, the inner portion of the process chamber is symmetrically formed by using a virtual line for connecting the jet part with the exhaust port as a reference, and the bottom portion of the process chamber is formed parallel with the wafer.
申请公布号 KR20030086951(A) 申请公布日期 2003.11.12
申请号 KR20030066950 申请日期 2003.09.26
申请人 KORNIC SYSTEMS CORP. 发明人 KIM, SEONG TAE;LEE, SEOK JEONG;SI, SEONG SU;SONG, DAE SEOK;YOEN, GANG HEUM
分类号 H01L21/324;H01J37/32;(IPC1-7):H01L21/324 主分类号 H01L21/324
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