发明名称 METHOD FOR FABRICATING ACTIVE LAYER OF SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING METAL OXIDE SEMICONDUCTOR TRANSISTOR USING THE SAME
摘要 PURPOSE: A method for fabricating an active layer of a semiconductor device is provided to prevent a problem arising from germanium segregation by forming a high density germanium segregation layer on an interface between silicon germanium and an oxide so that the germanium segregation layer is used as a channel of a metal oxide semiconductor(MOS) transistor after a heat treatment process. CONSTITUTION: A silicon germanium layer(22) and a silicon layer are sequentially formed on a semiconductor substrate(21). The silicon layer is oxidized to form the germanium segregation layer(22a) on the silicon germanium layer. A heat treatment process is performed to uniformly distribute germanium of the germanium segregation layer.
申请公布号 KR20030086804(A) 申请公布日期 2003.11.12
申请号 KR20020024990 申请日期 2002.05.07
申请人 ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 KANG, JIN YEONG;LIM, JEONG UK;SIM, GYU HWAN;SONG, YEONG JU
分类号 H01L21/335;(IPC1-7):H01L21/335 主分类号 H01L21/335
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