发明名称 |
METHOD FOR FABRICATING ACTIVE LAYER OF SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING METAL OXIDE SEMICONDUCTOR TRANSISTOR USING THE SAME |
摘要 |
PURPOSE: A method for fabricating an active layer of a semiconductor device is provided to prevent a problem arising from germanium segregation by forming a high density germanium segregation layer on an interface between silicon germanium and an oxide so that the germanium segregation layer is used as a channel of a metal oxide semiconductor(MOS) transistor after a heat treatment process. CONSTITUTION: A silicon germanium layer(22) and a silicon layer are sequentially formed on a semiconductor substrate(21). The silicon layer is oxidized to form the germanium segregation layer(22a) on the silicon germanium layer. A heat treatment process is performed to uniformly distribute germanium of the germanium segregation layer.
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申请公布号 |
KR20030086804(A) |
申请公布日期 |
2003.11.12 |
申请号 |
KR20020024990 |
申请日期 |
2002.05.07 |
申请人 |
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE |
发明人 |
KANG, JIN YEONG;LIM, JEONG UK;SIM, GYU HWAN;SONG, YEONG JU |
分类号 |
H01L21/335;(IPC1-7):H01L21/335 |
主分类号 |
H01L21/335 |
代理机构 |
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