发明名称 Four transistor static-random-access-memory cell
摘要 A four-transistor SRAM cell, which could be viewed as at least including two word line terminals, comprises the following elements: a first word line terminal, a second word line terminal, a first bit line terminal, a second bit line terminal, a first transistor, a second transistor, a third transistor, and a fourth transistor. The gate of the first transistor is coupled to the first word line terminal and the source of the first transistor is coupled to the first bit line terminal, the gate of the second transistor is coupled to the second word line terminal and the source of the second transistor is coupled to the second bit line terminal, the source of the third transistor is coupled to the drain of the first transistor and the gate of the third transistor is coupled to the drain of the second transistor, the source of the fourth transistor is coupled to the drain of the second transistor and the gate of the fourth transistor is coupled to the drain of the first transistor. Significantly, one essential characteristic of the memory cell is that two word line terminals are used to control the state of two independent transistors separately.
申请公布号 US6646310(B2) 申请公布日期 2003.11.11
申请号 US20010915930 申请日期 2001.07.26
申请人 UNITED MICROELECTRONICS CORP. 发明人 HSIAO CHIH-YUAN;TSAO PO-JAU
分类号 G11C11/412;H01L27/11;(IPC1-7):H01L29/772 主分类号 G11C11/412
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