发明名称 Thermally stable crystalline defect-free germanium bonded to silicon and silicon dioxide
摘要 A wafer pair comprising a substantially defect-free germanium wafer and methods of making the same. The wafer pair comprises the substantially defect-free germanium wafer directly bonded to a silicon wafer. The method of making the wafer pair comprises placing the silicon wafer in a wafer-bonding chamber, placing the germanium wafer on top or on bottom of the silicon wafer, and applying a local force to either the germanium wafer or to the silicon wafer to initiate bonding of the germanium wafer to the silicon wafer. The bonding occurs under a temperature ranging from about 23° C. to about 600° C. and under a vacuum condition inside a wafer-bonding chamber.
申请公布号 US6645831(B1) 申请公布日期 2003.11.11
申请号 US20020141596 申请日期 2002.05.07
申请人 INTEL CORPORATION 发明人 SHAHEEN MOHAMAD A.;JIN BEENYIH;CHAU ROBERT S.
分类号 H01L21/18;H01L21/285;H01L21/762;H01L29/165;H01L29/45;(IPC1-7):H01L21/30 主分类号 H01L21/18
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