| 摘要 |
An electronics testing circuit comprises a tested circuit (12) which includes testing cells (30,32) and a first transceiver (54) coupled to the cells (30,32). The first transceiver (54) is operable to transmit signals received from the testing cells (30,32) and to receive signals transmitted for the cells (30,32). A second transceiver (26) is operable to receive signals from the first transceiver (54) and send signals to the first transceiver (54). A testing device (18) is coupled to the second transceiver (26) and is operable to send signals to it for the testing cells (30,32) and receive signals from the testing cells (30,32).
|
