| 摘要 |
PURPOSE: A pogo pin of a semiconductor test apparatus is provided to be capable of contacting pogo pins to interface pads by constant strength. CONSTITUTION: An upper and lower contact pin(110,120) are contacted with a test board and a probe, respectively. The abnormal operation of the upper and lower contact pin(110,120) is prevented by a groove(130). A spring(140) is formed between the upper and lower contact pin so as to have tension. A metal conductive plate(150) is formed at the upper portion of the groove. A case(160) is fixed at the metal conductive plate. A light emitting body(170) is luminant when contacting the upper contact pin(110) to the metal conductive plate(150). A power source(180) is connected to the metal conductive plate for operating the light emitting body.
|
