发明名称 |
WINDOW TYPE PROBE, PLASMA MONITORING DEVICE, AND PLASMA PROCESSING DEVICE |
摘要 |
A window type probe, a plasma monitoring device, and a plasma processing device, the probe capable of directly and conveniently detecting the state of plasma generated by the application of a high frequency or a high voltage, comprising at least a conductive support member (5) having an opening part at least partly in the surface thereof opposed to the plasma and a dielectric member (1) having a probe electrode (2) on one surface thereof, wherein the dielectric member (1) is installed in the opening part of the conductive support member (5).
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申请公布号 |
WO03092059(A1) |
申请公布日期 |
2003.11.06 |
申请号 |
WO2003JP04016 |
申请日期 |
2003.03.28 |
申请人 |
JAPAN SCIENCE AND TECHNOLOGY CORPORATION;YASAKA, MITSUO |
发明人 |
YASAKA, MITSUO |
分类号 |
H05H1/00;C23C14/34;C23C16/52;H01J37/32;H01L21/205;H01L21/3065;(IPC1-7):H01L21/205 |
主分类号 |
H05H1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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