Optical configuration and method for differential refractive index measurements

摘要

An optical configuration for measuring a difference in refractive index between a first sample and a second sample comprises partitioned first and second optical interfaces symmetrically illuminated by an illumination beam to provide first and second partial beams defined by the refractive index of the first and second samples, respectively. First and second linear scanned arrays are positioned on opposite sides of a meridional plane of the optical configuration for respectively detecting the first and second partial beams. Thus, differential measurements are possible based on signal information from the arrays. Embodiments for critical angle and surface plasmon resonance refractive index measurements are disclosed. The disclosure also relates to methods for measuring a difference in refractive index between a first sample and a second sample in accordance with the described optical configuration embodiments.