发明名称 CLAMP FOR MATERIAL TESTING MACHINE
摘要 PROBLEM TO BE SOLVED: To provide a clamp for a material testing machine with which a very small test piece can be gripped optimally without being damaged. SOLUTION: A movable clamp part 13 is moved up to a fixed clamp part 12 via a movable mechanism part by a movement operation part 21, and a preliminary pressure to the extent of not damaging the test piece 11 is given in advance by a preliminary pressure pressurization part 22. A gripping face to the test piece 11 is formed of a porous material 17, its adsorption area is large, and a cavity at the inside of the fixed clamp part 12 or the movable clamp part 13 is made vacuum via the porous material 17 so as to grip the test piece 11. Thereby, the test piece 11 can be gripped optimally without being damaged. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003315227(A) 申请公布日期 2003.11.06
申请号 JP20020125538 申请日期 2002.04.26
申请人 TOSHIBA CORP 发明人 FUKUDA DAIJIRO;NAKATANI YUJIRO;TANAKA AKIRA;SAITO YUJI;ISHIWATARI YUTAKA;ITO YOSHIYASU
分类号 G01N3/04;(IPC1-7):G01N3/04 主分类号 G01N3/04
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