发明名称 ELECTRONIC COMPONENT TEST APPARATUS
摘要 An electronic component test apparatus for performing a test by pressing the input/output terminals of tested electronic components against the contact parts of a test head part (100) by a moving means with the tested electronic components mounted on electronic component feeding media (11, 12, 13, 14), wherein two sheets of electronic component feeding media (11, 12) having the tested electronic components mounted thereon are held by one moving means and, at the same time, two sheets of electronic component feeding media (13, 14) having the tested electronic components mounted thereon are held by the other moving means, and each moving means carries in and out the electronic component feeding media independently to the contact groups.
申请公布号 WO03091741(A1) 申请公布日期 2003.11.06
申请号 WO2002JP04124 申请日期 2002.04.25
申请人 ADVANTEST CORPORATION;ITO, AKIHIKO;NAKAMURA, HIROTO 发明人 ITO, AKIHIKO;NAKAMURA, HIROTO
分类号 G01R31/26;G01R31/28;H01L21/66;(IPC1-7):G01R31/26 主分类号 G01R31/26
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