APPARATUS AND METHOD FOR EVALUATION OF PIEZOSTACK

摘要

PROBLEM TO BE SOLVED: To provide a piezostack evaluation apparatus for evaluating a piezostack at an arbitrary temperature from a low temperature up to a high temperature and to provide a piezostack evaluation method. SOLUTION: The piezostack evaluation apparatus is provided with a stack housing chamber 2 used to house the piezostack 20; a load application means 40 and a voltage application means 51 used to apply a prescribed load and a prescribed voltage to the piezostack 20; a displacement detection means 30 used to measure a displacement amount of the piezostack 20; a load detection means 22 used to measure the load; and a measuring-means housing chamber 3 used to house the detection means 30 and the detection means 22 so as to maintain both at a heat-resistant temperature or lower. The housing chamber 2 and the housing chamber 3 are constituted so as to be thermally separated. COPYRIGHT: (C)2004,JPO