| 摘要 |
<p>A magnetic probe of a magnetic field generation type not forming a magnetic circuit and capable of accurately inspecting a part of the surface state and the inner state of an object to be inspected. A magnetic probe (1) generates an alternating magnetic field in the inners space of the object (2) containing a metal component and/or the surface space of the object (2) and detects a magnetic flux change in the vicinity of the surface of the object (2). The probe (1) includes an excitation coil (3) having a coil whose inner surface or outer surface is arranged to be along the surface of the object (2) and generating an alternating magnetic field along the surface of the object (2) inside and/or on the surface of the object, and a detection coil (4) (detection unit) arranged to oppose to a part of the surface of the object (2) so as to detect a magnetic flux change in the vicinity of the surface of the object (2). The detection coil (4) is arranged in the inner circumference of the excitation coil (3) or in the vicinity of it or on the outer circumference of the excitation coil (4) or in the vicinity of it.</p> |
