| 摘要 |
PROBLEM TO BE SOLVED: To simultaneously and stably measure the AC impedance (characteristic) of all the elements configurating a multiple chip, without being affected by stray capacitance even when an interval between external terminals such as a multiple chip component is narrow. SOLUTION: A measurement probe terminal 2a is abutted on an external terminal 1a of one-side element of two-element condenser array 1 as one of the multiple chip component, the probe terminal 2a and a capacitance meter 5 of a measuring machine 4a are connected by a signal cable 3a, a probe terminal 2b and a capacitance meter 5 of a measuring machine 4b are connected by a signal cable 3b, and the frequency f1, f2 supplied to the measuring machines 4a, 4b are standardized. COPYRIGHT: (C)2004,JPO
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