INTERFACE APPARATUS FOR INTEGRATED CIRCUIT TESTING

摘要

An apparatus and method for coupling a test head and probe card in an IC testing system incorporating patterned divider elements (24) disposed between rows of signal conductors (22) to provide matching characteristics impedance values along each row of signal conductors. The divider elements have a patterned conductive layer formed thereon that is electrically connected to ground, and a method for determining a useful pattern is provided. Test dividers (24) fabricated with openings of various size and shape are used to construct transmission lines. The impedance of these lines is measured, and the results are used to interpolate an appropriate opening size and shape to achieve a desired transmission line impedance.