发明名称 ELECTRONIC COMPONENT CHARACTERISTIC MEASURING DEVICE
摘要 <p>A chip-like electronic component characteristic measuring device, comprising first and second external terminal electrodes formed at the first and second end parts thereof opposed to each other, wherein a shield layer (15) extending so as to cross a position between first and second measurement terminals (9) and (10) is installed in a holder (14) for holding an electronic component (4) in the state of directing the first and second external terminal electrodes (2) and (3) toward the first and second opening ends (6) and (7) of a storage cavity (5) and electrically connected to a measurement reference potential (16), whereby a measurement error resulting from the dimensional variation of the electronic component (4) can be suppressed by reducing a floating capacity parasitic near the electronic component (4) by the shielded layer (15).</p>
申请公布号 WO2003091739(P1) 申请公布日期 2003.11.06
申请号 JP2003002826 申请日期 2003.03.11
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