| 摘要 |
<P>PROBLEM TO BE SOLVED: To shorten the monitoring time with respect to various events and to shorten the execution time of a program for testing a device under test, when the various events are not required (not required in a mass-production test with respect to a normal mass-produced semiconductor device) in a semiconductor testing apparatus. <P>SOLUTION: In an execution method for a semiconductor test program, the device under test is tested by using the semiconductor test program is which a procedure required for a test and data are contained. An execution-time shortening method for the semiconductor test program comprises a flag setting step in which a monitoring operation of the various events interrupted in a halfway of the test is sorted into a plurality of pieces so as to set flags corresponding to them, and a step used to detect the flags. An instruction regarding the monitoring operation of the various events is bypassed when any of the flags in a plurality is not detected. <P>COPYRIGHT: (C)2004,JPO |
