发明名称 SHARING HETERODYNE INTERFEROMETER
摘要 PROBLEM TO BE SOLVED: To provide an apparatus for measuring surface irregularities with a sensitivity of nanometer to sub-nanometer, where no crosstalk exists with less optical loss. SOLUTION: An orthogonal 2-frequency laser beam is split into two optical light paths using an order difference of a photoacoustic member. The advancing direction of the beam on the light path is split with a Rochon prism to obtain four light fluxes, while multiplexed so that two light fluxes of the light paths coincide, to generate three light fluxes. The three light fluxes are used to constitute a sharing heterodyne interferometer which uses three points. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003315006(A) 申请公布日期 2003.11.06
申请号 JP20020153137 申请日期 2002.04.18
申请人 SUZUKI NORITO 发明人 SUZUKI NORITO
分类号 G01B9/02;(IPC1-7):G01B9/02 主分类号 G01B9/02
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