| 摘要 |
PROBLEM TO BE SOLVED: To smooth a process work and to improve the reliability of a semiconductor device by measuring respective values of current flowing in each semiconductor device, and by rapidly removing a semiconductor device being in the malfunction and initial failures such as wrong insertion into a socket and the like. SOLUTION: The apparatus for testing the semiconductor device is composed of a supply voltage applying means which applies a supply voltage on a burn-in test board where a plurality of semiconductor devices are mounted thereon, a current measuring means 12 which measures current flowing in each semiconductor device, a memory section 26 which stores a prescribed reference value, a comparator section 27 which compares each value of current measured by the current measuring means with the prescribed reference value, a control unit 28 which judges whether each semiconductor device is normal or not based on the comparison result, and a display section 11 which displays the result of the judgement. By using the apparatus for testing the semiconductor device, the semiconductor device being in the malfunction such as short-circuiting therein or the like is rapidly specified and removed, thereby smoothing the process work and improving the reliability of semiconductor device. COPYRIGHT: (C)2004,JPO
|
