| 摘要 |
PURPOSE: A multiple scan chain for sharing pins and a designing method thereof are provided to reduce a test application time and the power consumption without increasing the number of pins by sharing the pins. CONSTITUTION: A multiple scan chain for sharing pins includes the first to the N-th scan chains and a plurality of scan clock inputs. The first to the N-th scan chains have plural scan inputs which are commonly connected to an input terminal(30). The first scan chain is formed with a plurality of scan cells(10,11,12). The second scan chain is formed with a plurality of scan cells(20,21,22). The N-th scan chain is formed with a plurality of scan cells(N0,N1,N2). The scan clock inputs are connected to plural scan clock signals. The multiple scan chain further includes a scan clock signal generator and a multiplexer(32). The scan clock signal generator is connected between the scan chains to generate plural scan clock signals in response to a single scan clock signal. The multiplexer(32) is used for connecting plural scan outputs to an output terminal(34).
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