发明名称 |
POLISHING METHOD, POLISHING APPARATUS AND METHOD FOR PRODUCING SEMICONDUCTOR DEVICE |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To energize an object to be polished to a polishing end point with stable current density distribution and enable the use of a conventional plating apparatus, cleaning apparatus or the like and the execution of production process flow. <P>SOLUTION: A substrate 1 formed with a metal film 2 and a counter electrode 3 are opposedly arranged at a predetermined interval in electrolyte. An electric current is applied to the metal film 2 from an anode 4 which is not in contact with the metal film 2 through electrolyte, and this metal film 2 is electrolytically polished and wiped through sliding of a pud on the metal film 2 while the substrate 1 is being rotated. <P>COPYRIGHT: (C)2004,JPO</p> |
申请公布号 |
JP2003311538(A) |
申请公布日期 |
2003.11.05 |
申请号 |
JP20020121333 |
申请日期 |
2002.04.23 |
申请人 |
SONY CORP |
发明人 |
SATO SHUZO;NOGAMI TAKESHI;TAKAHASHI SHINGO;KOMAI HISANORI;TAI KAORI;HORIKOSHI HIROSHI;OTORII SUGURU |
分类号 |
B23H5/08;B23H3/04;B23H3/08;C25D3/16;C25D7/00;C25F3/02;C25F3/22;C25F7/00;H01L21/304;H01L21/306;H01L21/3063;(IPC1-7):B23H5/08 |
主分类号 |
B23H5/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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