发明名称 |
Hybrid silicon on insulator/bulk strained silicon technology |
摘要 |
Silicon on insulator technology and strained silicon technology provide semiconductor devices with high performance capabilities. Shallow trench isolation technology provides smaller devices with increased reliability. Bulk silicon technology provides devices requiring deep ion implant capabilities and/or a high degree of thermal management. A semiconductor device including silicon on insulator regions, strained silicon layer, shallow trench isolation structures, and bulk silicon regions is provided on a single semiconductor substrate.
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申请公布号 |
US6642536(B1) |
申请公布日期 |
2003.11.04 |
申请号 |
US20010015802 |
申请日期 |
2001.12.17 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
XIANG QI;SULTAN AKIF |
分类号 |
H01L21/762;H01L21/84;H01L27/12;H01L29/786;(IPC1-7):H01L29/06;H01L31/032;H01L31/033;H01L31/072;H01L31/109 |
主分类号 |
H01L21/762 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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