发明名称 Method of testing radiation for a SDRAM
摘要 A method for testing for radiation on a synchronized dynamic random access memory (SDRAM), wherein an irradiation controller irradiates the SDRAM. The status of the SDRAM after a radiation test are calculated. The radiation tests comprise SEU, micro latch-up, SEL and get rapture tests. From the radiation test, we can understand the condition of the SDRAM before and after the radiation test.
申请公布号 US6642725(B2) 申请公布日期 2003.11.04
申请号 US20010895549 申请日期 2001.06.28
申请人 CHUNG-SHAN INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 JUHN LI-SHEN;WU KUANG-SHYR;LIN MAW-CHING
分类号 G01R31/00;G01R31/28;G11C5/00;G11C29/40;G11C29/50;(IPC1-7):G01R31/302;G01R31/26;G21G5/00;G11G29/00 主分类号 G01R31/00
代理机构 代理人
主权项
地址
您可能感兴趣的专利