发明名称 THERMAL FLUX PROCESSING BY SCANNING ELECTROMAGNETIC RADIATION
摘要 The thermal processing device includes a stage, a continuous wave electromagnetic radiation source, a series of lenses, a translation mechanism, a detection module, a three-dimensional auto-focus, and a computer system. The stage is configured to receive a substrate thereon. The continuous wave electromagnetic radiation source is disposed adjacent the stage, and is configured to emit continuous wave electromagnetic radiation along a path towards the substrate. The series of lenses is disposed between the continuous wave electromagnetic radiation source and the stage, and are configured to condense the continuous wave electromagnetic radiation into a line of continuous wave electromagnetic radiation on a surface of the substrate. The translation mechanism is configured to translate the stage and the line of continuous wave electromagnetic radiation relative to one another. The detection module is positioned within the path, and is configured to detect continuous wave electromagnetic radiation.
申请公布号 AU2003262388(A1) 申请公布日期 2003.11.03
申请号 AU20030262388 申请日期 2003.04.18
申请人 APPLIED MATERIALS, INC. 发明人 DEAN C. JENNINGS;MARK YAM;ABHILASH, J. MAYUR;VERNON BEHRENS;PAUL, A. O'BRIEN;LEONID, M. TERTITSKI;ALEXANDER GOLDIN
分类号 B23K26/03;B23K26/06;B23K26/073;B23K26/08;B23K26/12;B23K26/34;B23K26/42;C23C8/00;C23C8/10;C23C8/22;C23C16/04;C23C16/48;H01L21/20 主分类号 B23K26/03
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