发明名称 METHOD FOR FABRICATING CAPACITOR BY ELECTROCHEMICAL DEPOSITION METHOD
摘要 PURPOSE: A method for fabricating a capacitor by an electrochemical deposition method is provided to improve a characteristic of the capacitor by forming a ruthenium thin film of a better quality than that of a ruthenium thin film fabricated by a metal organic deposition method. CONSTITUTION: An insulation layer on a substrate(20) is selectively etched to form a contact hole of the capacitor. A contact medium including a nitride is formed inside the contact hole to leave the upper step of the contact hole. A metal seed layer(25) for an electrochemical deposition method is formed to cover the insulation layer while filling the remaining upper step of the contact hole. A capacitor sacrificial layer in which a region overlapping the contact hole is opened is formed on the metal seed layer. A ruthenium layer is formed as a capacitor electrode in the open region of the sacrificial layer by an electrochemical deposition method.
申请公布号 KR20030084332(A) 申请公布日期 2003.11.01
申请号 KR20020023000 申请日期 2002.04.26
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHOI, HYEONG BOK;SONG, CHANG ROK
分类号 H01L27/04;H01L21/02;H01L21/288;H01L21/768;(IPC1-7):H01L27/04 主分类号 H01L27/04
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