发明名称 |
METHOD FOR FABRICATING CAPACITOR BY ELECTROCHEMICAL DEPOSITION METHOD |
摘要 |
PURPOSE: A method for fabricating a capacitor by an electrochemical deposition method is provided to improve a characteristic of the capacitor by forming a ruthenium thin film of a better quality than that of a ruthenium thin film fabricated by a metal organic deposition method. CONSTITUTION: An insulation layer on a substrate(20) is selectively etched to form a contact hole of the capacitor. A contact medium including a nitride is formed inside the contact hole to leave the upper step of the contact hole. A metal seed layer(25) for an electrochemical deposition method is formed to cover the insulation layer while filling the remaining upper step of the contact hole. A capacitor sacrificial layer in which a region overlapping the contact hole is opened is formed on the metal seed layer. A ruthenium layer is formed as a capacitor electrode in the open region of the sacrificial layer by an electrochemical deposition method.
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申请公布号 |
KR20030084332(A) |
申请公布日期 |
2003.11.01 |
申请号 |
KR20020023000 |
申请日期 |
2002.04.26 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHOI, HYEONG BOK;SONG, CHANG ROK |
分类号 |
H01L27/04;H01L21/02;H01L21/288;H01L21/768;(IPC1-7):H01L27/04 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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