发明名称 |
APPARATUS AND METHOD FOR MAKING POGO PIN CONTACT POGO FIXING UNIT OF SEMICONDUCTOR INSPECTING APPARATUS |
摘要 |
PURPOSE: A method for making a pogo pin contact a pogo fixing unit of a semiconductor inspecting apparatus is provided to prevent a probe card from being transformed by supplying vacuum absorption force from the probe card while a test head stands by in a predetermined position and is capable of moving. CONSTITUTION: The test head(15) decreases by its own weight. Air with a controlled predetermined pressure is supplied to make the test head stand by in a predetermined position while the test head is capable of moving. A vacuum absorption operation is performed in the probe card(13). The test head decreases by vacuum absorption force so that the pogo pin(14a) comes in contact with the pogo fixing unit(13a).
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申请公布号 |
KR20030084052(A) |
申请公布日期 |
2003.11.01 |
申请号 |
KR20020022527 |
申请日期 |
2002.04.24 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
BAEK, SEUNG GUK |
分类号 |
H01L21/66;(IPC1-7):H01L21/66 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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