发明名称 APPARATUS AND METHOD FOR MAKING POGO PIN CONTACT POGO FIXING UNIT OF SEMICONDUCTOR INSPECTING APPARATUS
摘要 PURPOSE: A method for making a pogo pin contact a pogo fixing unit of a semiconductor inspecting apparatus is provided to prevent a probe card from being transformed by supplying vacuum absorption force from the probe card while a test head stands by in a predetermined position and is capable of moving. CONSTITUTION: The test head(15) decreases by its own weight. Air with a controlled predetermined pressure is supplied to make the test head stand by in a predetermined position while the test head is capable of moving. A vacuum absorption operation is performed in the probe card(13). The test head decreases by vacuum absorption force so that the pogo pin(14a) comes in contact with the pogo fixing unit(13a).
申请公布号 KR20030084052(A) 申请公布日期 2003.11.01
申请号 KR20020022527 申请日期 2002.04.24
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 BAEK, SEUNG GUK
分类号 H01L21/66;(IPC1-7):H01L21/66 主分类号 H01L21/66
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