| 摘要 |
<P>PROBLEM TO BE SOLVED: To prevent crashing of signals when a signal direction of an I/O module is switched for a LSI scan test. <P>SOLUTION: The scan test circuit comprises a scan mode selection means, at least a pair of I/O modules connected to a scanned circuit subject to scan test, and a scan IO control signal means. When a scan mode is selected, either module of the pair of I/O modules is set to an output terminal, and the other module is set to an input terminal based on the scan IO control signal. During scanning, the I/O module as the input terminal is connected with a scan input side of the scanned circuit, while the I/O module as the output terminal is connected with a scan output side of the scanned circuit. During capturing, the I/O module as the input terminal is connected with a data input side of the scanned circuit at a normal operation, while the I/O module as the output terminal is connected with a data output side of the scanned circuit at a normal operation. <P>COPYRIGHT: (C)2004,JPO |
