发明名称 SOI WAFER AND MANUFACTURING METHOD OF SOI WAFER
摘要 PROBLEM TO BE SOLVED: To provide an SOI wafer preventing an SOI layer from being charged by electrostatics in the manufacturing process of the SOI wafer or a device, and to provide a manufacturing method of the SOI wafer. SOLUTION: The SOI wafer is formed of at least the SOI layer, an insulation layer and a support substrate, is provided with a charge preventing means for preventing the SOI layer from being charged at one part of the SOI layer. A connecting part for conducting the outer peripheral end of the SOI layer and the support substrate is formed after a process for particularly forming an SOI structure constituted of the SOI layer, the insulation layer and the support substrate. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003309253(A) 申请公布日期 2003.10.31
申请号 JP20030038908 申请日期 2003.02.17
申请人 SHIN ETSU HANDOTAI CO LTD 发明人 NEZU SHIGEYOSHI;ITO TATSUO;KATSUOKA NOBUO;OKUMURA KATSUYA
分类号 H01L21/762;H01L21/02;H01L21/265;H01L21/76;H01L23/52;H01L27/12;(IPC1-7):H01L27/12 主分类号 H01L21/762
代理机构 代理人
主权项
地址