发明名称 |
SOI WAFER AND MANUFACTURING METHOD OF SOI WAFER |
摘要 |
PROBLEM TO BE SOLVED: To provide an SOI wafer preventing an SOI layer from being charged by electrostatics in the manufacturing process of the SOI wafer or a device, and to provide a manufacturing method of the SOI wafer. SOLUTION: The SOI wafer is formed of at least the SOI layer, an insulation layer and a support substrate, is provided with a charge preventing means for preventing the SOI layer from being charged at one part of the SOI layer. A connecting part for conducting the outer peripheral end of the SOI layer and the support substrate is formed after a process for particularly forming an SOI structure constituted of the SOI layer, the insulation layer and the support substrate. COPYRIGHT: (C)2004,JPO
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申请公布号 |
JP2003309253(A) |
申请公布日期 |
2003.10.31 |
申请号 |
JP20030038908 |
申请日期 |
2003.02.17 |
申请人 |
SHIN ETSU HANDOTAI CO LTD |
发明人 |
NEZU SHIGEYOSHI;ITO TATSUO;KATSUOKA NOBUO;OKUMURA KATSUYA |
分类号 |
H01L21/762;H01L21/02;H01L21/265;H01L21/76;H01L23/52;H01L27/12;(IPC1-7):H01L27/12 |
主分类号 |
H01L21/762 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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