发明名称 |
PRODUCTION METHOD FOR RESIST PATTERN |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a production method for a high definition resist pattern at the time of using chemical amplification type resist and a conductive film. <P>SOLUTION: The manufacturing method for the resist pattern comprises: the irradiation process of irradiating a base material having a chemical amplification type resist layer and the conductive film formed on the chemical amplification type resist layer for discharging acid by heating on one surface with electron beams in a pattern shape from the conductive film side; the conductive film removal process of removing the conductive film from a substrate irradiated with the electron beams; the post-exposure baking process of executing post- exposure baking of the substrate from which the conductive film is removed; and the development process of performing development on the substrate to which the post-exposure baking is executed and forming a pattern composed of the chemical amplification type resist. <P>COPYRIGHT: (C)2004,JPO |
申请公布号 |
JP2003307856(A) |
申请公布日期 |
2003.10.31 |
申请号 |
JP20020111383 |
申请日期 |
2002.04.12 |
申请人 |
DAINIPPON PRINTING CO LTD |
发明人 |
SASAKI SHIHO;KURIHARA MASAAKI;FUJII AKIKO |
分类号 |
G03F7/038;G03F7/039;G03F7/09;G03F7/11;G03F7/20;G03F7/26;H01L21/027 |
主分类号 |
G03F7/038 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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