发明名称 SUPPORTING APPARATUS FOR DETERIORATION EVALUATION OF DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a supporting apparatus for a deterioration evaluation of a device by which the deterioration evaluation of a plant device is executed efficiently without being affected by a technical level of an evaluation operator and whose maintainability of an evaluation result is superior. <P>SOLUTION: When a deterioration-event extraction part 11 executes the deterioration evaluation of the plant device, it extracts a deterioration event candidate on the basis of data on a component constituting the plant device and data on an aged deterioration, and it extracts a deterioration event requiring an evaluation from the deterioration event candidate on the basis of data on a maintenance hysteresis. A deterioration-event evaluation part 17 creates and outputs evaluation data on the deterioration event extracted in the extraction part 11, and a maintenance-plan decision part 19 outputs a maintenance plan as a maintenance map on the basis of the evaluation data by the evaluation part 17 and on the basis of a designated creation condition. <P>COPYRIGHT: (C)2004,JPO</p>
申请公布号 JP2003307469(A) 申请公布日期 2003.10.31
申请号 JP20020111579 申请日期 2002.04.15
申请人 TOSHIBA CORP 发明人 MORO HIROYUKI
分类号 G01M99/00;G01N17/00;G05B23/02;(IPC1-7):G01M19/00 主分类号 G01M99/00
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