发明名称 SEMICONDUCTOR MEMORY
摘要 <P>PROBLEM TO BE SOLVED: To shorten an access time of a semiconductor memory. <P>SOLUTION: Each of memory cells (1) is constituted of an access transistor (6) for sensing, an access transistor (7) for restoring, and a memory capacitor (8). The sense access transistor is coupled to a sense word line (SWL) and the memory capacitor is coupled to a sense bit line (SBL). The restore-access transistor couples the memory capacitor to a restore-bit line (RBL) conforming to a signal on a restore-word line (RWL). Electric charge of the memory capacitor are transferred to a sense amplifier (2) through the sense bit line, and sense data of the sense amplifier is transferred to the original memory capacitor through a restore-amplifier (3) and the restore-access transistor. An output signal line of the sense amplifier is separated electrically from the sense bit line and the restore-bit line. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2003308693(A) 申请公布日期 2003.10.31
申请号 JP20020109462 申请日期 2002.04.11
申请人 MITSUBISHI ELECTRIC CORP 发明人 TSUKIKAWA YASUHIKO;ARIKI TAKUYA;TANIDA SUSUMU;MARUYAMA YUKIKO
分类号 H01L27/108;G11C11/401;G11C11/405;G11C11/406;H01L21/8242 主分类号 H01L27/108
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