发明名称 VISUAL INSPECTION METHOD AND APPARATUS FOR CONDUCTIVE FINE PARTICLE
摘要 PROBLEM TO BE SOLVED: To provide a visual inspection method and a visual inspection apparatus of conductive particulates for easily inspecting the entire surface of the conductive particulates. SOLUTION: In the method for visually inspecting the conductive particulates where the surface of a spheroidal resin particulates is plated by metal, at least two rollers are arranged nearly in parallel while the gap between two adjacent rollers becomes smaller than the diameter of the conductive particulate, the conductive particulate is arranged between the two adjacent rollers, and the two or more rollers are all rotated in the same direction for rotating the conductive particulate for inspecting the entire surface of the conductive particulate. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003307495(A) 申请公布日期 2003.10.31
申请号 JP20020113507 申请日期 2002.04.16
申请人 SEKISUI CHEM CO LTD 发明人 OKUDA MASAMI
分类号 G01N21/85;(IPC1-7):G01N21/85 主分类号 G01N21/85
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